Our main expertise lies in semiconductor materials and devices, although many of the techniques used for microanalysis are generic, i.e. can be applied to a very wide range of materials issues.

We have direct experience of:

• Bipolar and CMOS silicon
• SOI
• High mobility III-V devices (GaAs, InSb)
• III-V optoelectronic devices
• Quantum dot and dash materials
• Epitaxial growth issues
• MEMS
• Functional ceramics (PbZrTiO3, SrTiO3...)
• Metallisation
• Dielectrics
• Optical coatings
• Glasses
• Solders
• Packaging technology
• De-encapsulation techniques
• ESD failures
• Burn-in and life test failures
• Customer returns
• And more...