Integrity Scientific Ltd, registered in UK 06296058
Integrity Scientific
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Bulk materials
Thin films
Semiconductors
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The properties of bulk materials are determined by their composition and microstructure.  Microanalysis techniques give you access to parametrs such as composition, phase, grain size, voiding etc.

We can perform compositional analyses on a variety of materials, determine crystalline phases and texture, measure grain size, void density and many other measurements.

Integrity Scientific Ltd, registered in UK 06296058 | contact@integrityscientific.com

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