Our key skills lie in the expertise we bring to your analysis needs or problems.
We have a wide range of experience across many materials systems:
Silicon devices (bipolar, CMOS)
And strong expertise in many structural anaysis techniques:
Transmission Electron Microscopy (TEM)
Focused ion beam (FIB)
Scanning electron microscopy (SEM)
Compositional analysis (EDX)
Atomic force microscopy (AFM)
Our knowledge of the processes you are using, the important parameters for your end product, and the analysis techniques which can be used to produce critical data means that we can give an insight into your problems more quickly and effectively than others with expertise in just one field.
Integrity Scientific Ltd, registered in UK 06296058 | email@example.com